Scanning Electron Microscopy :Physics of Image Formation and Microanalysis - Springer Series in Optical Sciences
Scanning Electron Microscopy :Physics of Image Formation and Microanalysis - Springer Series in Optical Sciences
paperback
Published:
1 December, 2010
paperback
Published:
1 December, 2010
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Description
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
More Details
| Type | Book |
|---|---|
| ISBN13 | 9783642083723 |
| ISBN10 | 3642083722 |
| Number Of Pages | 529 |
| Item Weight | 1000 g |
| Publisher / Reseller | Springer-Verlag Berlin and Heidelberg GmbH & Co. KG |
| Format | paperback |
| Edition | Second Edition 1998 |
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Media Reviews
"...this book is both linguistically and scientifically outstanding. It is an inspiring book for beginners and experienced SEM operators alike. The list of references is especially useful. This volume makes an outstanding contribution to the deeper understanding of the SEM."
T Mulvey, Measurement Science and Technology. 11, No12, December 2000