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Backscattering from Multiscale Rough Surfaces with Application to Wind Scatterometry
Backscattering from Multiscale Rough Surfaces with Application to Wind Scatterometry
hardback
Published:
31 May, 2015
hardback
Published:
31 May, 2015
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Description
This resource explains and demonstrates the backscattering properties of multiscale rough surfaces, and illustrates their application to establish the geophysical model function (GMF) needed in wind scatterometry. This book also explains how the mechanisms of backscattering change with frequency and the incident angle on a multiscale surface and how to recognize single scale versus multiscale surfaces - very useful information for those wanting to use backscattering models more efficiently.
More Details
| Type | Book |
|---|---|
| ISBN13 | 9781630810009 |
| ISBN10 | 1630810002 |
| Number Of Pages | 328 |
| Item Weight | 1000 g |
| Publisher / Reseller | Artech House Publishers |
| Format | hardback |
| Edition | Unabridged edition |
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Author's Bio
Adrian K. Fung was previously the director of the Wave Scattering Research Center and Jenkins Garrett professor of electrical engineering, and a member of the Academy of Distinguished Scholars at the University of Texas at Arlington. Dr. Fung is also a life fellow of the Institute of Electrical and Electronic Engineers and a member of U.S. Commission F of the International Scientific Radio Union. He earned his Ph.D. from the University of Kansas, Lawrence.