Unified Optical Scanning Technology

Unified Optical Scanning Technology

Unified Optical Scanning Technology

(Author)
hardback
Published: 25 February, 2003
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Description

Written by an award-winning leader in the field, this is a thoroughly integrated overview of the many facets and disciplines of optical scanning. Of particular utility to both practitioner and student are such features as:
  • An overview of the technology and unifying principles, including active and passive scanning, optical transfer, and system architecture
  • In-depth chapters on scanning theory and processes, scanned resolution, scanner devices and techniques, and the control of scanner beam misplacemen
  • A comprehensive review of the government-sponsored research of agile beam steering, now primed for commercial adaptation
  • A unique focus on the Lagrange invariant and its revealing resolution invariant
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More Details

Type Book
ISBN13 9780471316541
ISBN10 0471316547
Number Of Pages 200
Item Weight 435 g
Product Dimensions 162 x 242 x 19 mm
Publisher / Reseller John Wiley & Sons Inc
Format hardback
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Media Reviews

"It will be of interest to graduate students as well as researchers and engineers." (Optik 117, 2006)

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Author's Bio

LEO BEISER retired recently as the president and research director of Leo Beiser Inc., a consulting and research company specializing in image and data scanning and recording for global clients including 3M, Agfa-Gevaert, Bell Labs, Boeing, Burroughs, Compugraphic, Kodak, Canon, General Electric, Polaroid, Scitex, and Xerox. Prior to that, as a staff researcher and project manager at CBS Laboratories, Autometric/Raytheon, Radio Receptor Corporation, and Polarad Electronics Corp., he pioneered formative advances in super-high resolution/speed image and data scanning and recording. An extensively published author and internationally renowned expert, Beiser has been recognized by his profession with numerous awards including the prestigious George W. Goddard Award from the International Society for Optical Engineering. Leo Beiser is Adjunct Professor in the Institute of Imaging Science, Polytechnic University, New York

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