Unified Optical Scanning Technology
Unified Optical Scanning Technology
hardback
Published:
25 February, 2003
Description
- An overview of the technology and unifying principles, including active and passive scanning, optical transfer, and system architecture
- In-depth chapters on scanning theory and processes, scanned resolution, scanner devices and techniques, and the control of scanner beam misplacemen
- A comprehensive review of the government-sponsored research of agile beam steering, now primed for commercial adaptation
- A unique focus on the Lagrange invariant and its revealing resolution invariant
More Details
| Type | Book |
|---|---|
| ISBN13 | 9780471316541 |
| ISBN10 | 0471316547 |
| Number Of Pages | 200 |
| Item Weight | 435 g |
| Product Dimensions | 162 x 242 x 19 mm |
| Publisher / Reseller | John Wiley & Sons Inc |
| Format | hardback |
Media Reviews
"It will be of interest to graduate students as well as researchers and engineers." (Optik 117, 2006)
Author's Bio
LEO BEISER retired recently as the president and research director of Leo Beiser Inc., a consulting and research company specializing in image and data scanning and recording for global clients including 3M, Agfa-Gevaert, Bell Labs, Boeing, Burroughs, Compugraphic, Kodak, Canon, General Electric, Polaroid, Scitex, and Xerox. Prior to that, as a staff researcher and project manager at CBS Laboratories, Autometric/Raytheon, Radio Receptor Corporation, and Polarad Electronics Corp., he pioneered formative advances in super-high resolution/speed image and data scanning and recording. An extensively published author and internationally renowned expert, Beiser has been recognized by his profession with numerous awards including the prestigious George W. Goddard Award from the International Society for Optical Engineering. Leo Beiser is Adjunct Professor in the Institute of Imaging Science, Polytechnic University, New York