Applied Scanning Probe Methods IX: Characterization: v. 9 (NanoScience and Technology)

Applied Scanning Probe Methods IX: Characterization: v. 9 (NanoScience and Technology)

by HaraldFuchs (Editor), Bharat Bhushan (Editor), Masahiko Tomitori (Editor)

Synopsis

The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely and comprehensive overview of SPM applications.

$261.51

Quantity

20+ in stock

More Information

Format: Hardcover
Pages: 447
Edition: illustrated edition
Publisher: Springer
Published: 11 Jan 2008

ISBN 10: 3540740821
ISBN 13: 9783540740827