Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy (Springer Laboratory)

Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy (Springer Laboratory)

by TakeshiMatsuura (Author), K.C.Khulbe (Author), C . Y . Feng (Author)

Synopsis

Researchers in polymeric membranes as well as R&D professionals will find this work an essential addition to the literature. It concentrates on the method recently developed to study the surfaces of synthetic polymeric membranes using an Atomic Force Microscope (AFM), which is fast becoming a very important tool. Each chapter includes information on basic principles, commercial applications, an overview of current research and guidelines for future research.

$169.05

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20+ in stock

More Information

Format: Hardcover
Pages: 216
Publisher: Springer
Published: 17 Dec 2007

ISBN 10: 3540739939
ISBN 13: 9783540739937