Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)

Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)

by Adam Foster (Author), WernerA.Hofer (Author)

Synopsis

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory.

$241.41

Quantity

20+ in stock

More Information

Format: Hardcover
Pages: 295
Edition: illustrated edition
Publisher: Springer
Published: 07 Aug 2006

ISBN 10: 0387400907
ISBN 13: 9780387400907