Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

by R.F.Egerton (Author)

Synopsis

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

$168.80

Quantity

20+ in stock

More Information

Format: Hardcover
Pages: 202
Edition: 1st ed. 2005. Corr. 2nd printing
Publisher: Springer
Published: 01 May 2008

ISBN 10: 0387258000
ISBN 13: 9780387258003